Static secondary ion mass spectrometry for nanoscale analysis: Surface characterisation of electrospun nanofibres

Rapid Communications in Mass Spectrometry

Volumn 20, Issue 3, 2006, Pages 346-352

  Van Royen, Pieter ^a   Schacht, Etienne ^b   Ruys, Luc ^c   Van Vaeck, Luc ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b Polymer Materials Research Group   (Belgium)

^c CENTEXBEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ACETONE; ADDITIVES; IONS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

ANALYSIS SURFACE; CETYLTRIMETHYLAMMONIUM BROMIDE; ELECTROSPUN NANOFIBERS; ELECTROSPUNS; NANOSCALE ANALYSIS; NANOWEB; NON-WOVEN; STATIC SECONDARY ION MASS SPECTROMETRIES; SURFACE CHARACTERIZATION; TEST CASE;

NANOFIBERS;

EID: 32044449800     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.2311     Document Type: Article

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