Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS)

Fresenius' Journal of Analytical Chemistry

Volumn 370, Issue 5, 2001, Pages 654-662

  Lenaerts, Jens ^b   Verlinden, Geert ^b   Ignatova, Velislava A ^b   Van Vaeck, Luc ^b   Gijbels, Renaat ^b   Geuens, Ingrid ^a  

^a AGFA GEVAERT N V   (Belgium)

^b UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034914765     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160100880     Document Type: Conference Paper

References (27)

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