Carrier-to-noise ratio enhancement of super-resolution near-field structure disks by Ag nanostructure

Applied Physics Letters

Volumn 88, Issue 5, 2006, Pages 1-3

  Arai, T ^a   Kurihara, K ^a   Nakano, T ^a   Tominaga, J ^a   Rockstuhl, C ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; COMPUTER SIMULATION; DIELECTRIC MATERIALS; LENSES; SILVER; SPURIOUS SIGNAL NOISE; THIN FILMS;

APERTURE LENS SYSTEM; DIELECTRIC LAYER THICKNESS; DIELECTRIC LAYERS; SILVER NANOSTRUCTURE;

NANOSTRUCTURED MATERIALS;

EID: 31944441265     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2172017     Document Type: Article

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