Long-ranged and short-ranged electrostatic interaction between modified silicon surfaces and recombinant ferritin molecules

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 7 B, 2005, Pages 5374-5377

  Hayashi, Tomohiro ^a,b   Hara, Masahiko ^a,b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

Adsorption; Atomic force microscopy; DLVO; Electrostatic interaction; Ferritin; Hydration force; Protein; Self assembled monolayer; Silicon; Van der Waals

Indexed keywords

ADSORPTION; AMINO ACIDS; ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; SELF ASSEMBLY; VAN DER WAALS FORCES;

ELECTROSTATIC INTERACTION; FERRITIN; HYDRATION FORCE;

SILICON;

EID: 31844456790     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.5374     Document Type: Article

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