Qualitative adsorption measurements with an atomic force microscope

Langmuir

Volumn 14, Issue 20, 1998, Pages 5676-5679

  Larson, Ian ^a,b   Pugh, Robert J ^a  

^a INSTITUTE FOR SURFACE CHEMISTRY   (Sweden)

^b UNIVERSITY OF SOUTH AUSTRALIA   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; SILICON NITRIDE; SOLUTIONS; SUBSTRATES; VISCOSITY;

ATOMIC FORCE MICROSCOPE CANTILEVERS;

ADSORPTION;

EID: 0032162576     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la980294q     Document Type: Article

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