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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 1 B, 2006, Pages 409-412

Characterization of COOH-terminated self-assembled monolayers and adsorption efficiency of DNA molecules studied by X-ray photoelectron spectroscopy and near-edge X-ray absorption fine structure spectroscopy

(6) Ito, Eisuke a Nakamura, Fumio a,b Kanai, Kaname c Ouchi, Yukio c Seki, Kazuhiko c Hara, Masahiko a,d

a RIKEN (Japan)

b JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

c NAGOYA UNIVERSITY (Japan)

d TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

Carboxyl terminated SAM; DNA immobilization; NEXAFS; Self assembled monolayer (SAM); XPS

Indexed keywords

ABSORPTION SPECTROSCOPY; ADSORPTION; POLARIZATION; SELF ASSEMBLY; SPECTROSCOPIC ANALYSIS; SUBSTRATES; SULFUR COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

CARBOXYL-TERMINATED SAM; DNA IMMOBILIZATION; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE (NEXAFS) SPECTROSCOPY; NEXAFS;

DNA;

EID: 31844455359 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.45.409 Document Type: Article

Times cited : (2)

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