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Volumn 44, Issue 9 B, 2005, Pages 7098-7102

Dependence of microwave properties of BaxSr 1-xTiOx thin films on substrate

Author keywords

BST; Films; Microwave; Phase shift; Substrate

Indexed keywords

CRYSTALLINE MATERIALS; DIELECTRIC LOSSES; EPITAXIAL GROWTH; MICROWAVES; PHASE SHIFT; SUBSTRATES; THIN FILMS;

EID: 31844438908     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.7098     Document Type: Article
Times cited : (10)

References (10)
  • 8
    • 0004099829 scopus 로고    scopus 로고
    • John Wiley and Sons, New York, 2nd ed.
    • D. M. Pozar: Microwave Engineering (John Wiley and Sons, New York, 1998) 2nd ed., p. 217.
    • (1998) Microwave Engineering , pp. 217
    • Pozar, D.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.