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Volumn 245, Issue 1-2, 2006, Pages 87-92

An XPS investigation of the interaction mechanism between AlEt3 and TiCl4 supported on sputtered native SiOx layer

Author keywords

SiOx Si; Titanium chloride; Triethylaluminum; X ray photoelectron spectroscopy

Indexed keywords

ALUMINUM COMPOUNDS; OLEFINS; ORGANOMETALLICS; POLYMERIZATION; TITANIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 31644451955     PISSN: 13811169     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.molcata.2005.09.018     Document Type: Article
Times cited : (9)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.