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Volumn 245, Issue 1-2, 2006, Pages 87-92
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An XPS investigation of the interaction mechanism between AlEt3 and TiCl4 supported on sputtered native SiOx layer
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Author keywords
SiOx Si; Titanium chloride; Triethylaluminum; X ray photoelectron spectroscopy
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Indexed keywords
ALUMINUM COMPOUNDS;
OLEFINS;
ORGANOMETALLICS;
POLYMERIZATION;
TITANIUM COMPOUNDS;
X RAY PHOTOELECTRON SPECTROSCOPY;
SIOX/SI;
TITANIUM CHLORIDE;
TRIETHYLALUMINUM;
SILICA;
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EID: 31644451955
PISSN: 13811169
EISSN: None
Source Type: Journal
DOI: 10.1016/j.molcata.2005.09.018 Document Type: Article |
Times cited : (9)
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References (22)
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