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Volumn 85, Issue 29, 2005, Pages 3477-3486

Defect formation of Au thin films on SiO2/Si upon annealing

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CATALYSIS; DEFECTS; GOLD; SCANNING TUNNELING MICROSCOPY; SILICA; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 31644448500     PISSN: 14786435     EISSN: 14606992     Source Type: Journal    
DOI: 10.1080/1476430500199245     Document Type: Article
Times cited : (9)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.