|
Volumn 85, Issue 29, 2005, Pages 3477-3486
|
Defect formation of Au thin films on SiO2/Si upon annealing
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ANNEALING;
CATALYSIS;
DEFECTS;
GOLD;
SCANNING TUNNELING MICROSCOPY;
SILICA;
X RAY PHOTOELECTRON SPECTROSCOPY;
AU FILMS;
CATALYTIC ACTIVITIES;
INTERDIFFUSION;
THIN FILMS;
|
EID: 31644448500
PISSN: 14786435
EISSN: 14606992
Source Type: Journal
DOI: 10.1080/1476430500199245 Document Type: Article |
Times cited : (9)
|
References (25)
|