메뉴 건너뛰기




Volumn 48, Issue 2, 1999, Pages 314-318

Measurements of the AC longitudinal resistance of a GaAs-AlGaAs quantum Hall device

Author keywords

AC measurements; Impedance measurements; Longitudinal resistance; Quantum Hall effect

Indexed keywords


EID: 0000818628     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.769591     Document Type: Article
Times cited : (15)

References (9)
  • 1
    • 0027580851 scopus 로고
    • Comparison of precision ac and dc measurements with the quantized Hall resistance
    • J. Melcher, p. Warnecke, and R. Hanke, "Comparison of precision ac and dc measurements with the quantized Hall resistance," IEEE Trans. Instrum. Meas., vol. 42, pp. 292-294, 1993.
    • (1993) IEEE Trans. Instrum. Meas. , vol.42 , pp. 292-294
    • Melcher, J.1    Warnecke, P.2    Hanke, R.3
  • 2
    • 0001390031 scopus 로고
    • Accurate ac measurements of the quantized Hall resistance from 1 Hz to 1.6 kHz
    • F. Delahaye, "Accurate ac measurements of the quantized Hall resistance from 1 Hz to 1.6 kHz," Metrologia, vol. 31, pp. 367-373, 1994.
    • (1994) Metrologia , vol.31 , pp. 367-373
    • Delahaye, F.1
  • 4
    • 0030422474 scopus 로고    scopus 로고
    • AC measurements of the minimum longitudinal resistance of a QHE sample from 10 Hz to 10 kHz
    • F.P.M. Piquemal, G. R. Trapon, and G. P. J. Geneves, "AC measurements of the minimum longitudinal resistance of a QHE sample from 10 Hz to 10 kHz," IEEE Trans. Instrum. Meas., vol. 45, pp. 918-922, 1996.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , pp. 918-922
    • Piquemal, F.P.M.1    Trapon, G.R.2    Geneves, G.P.J.3
  • 5
    • 0031119407 scopus 로고    scopus 로고
    • Evaluation of the ac quantized Hall resistance
    • B.M. Wood, A. D. Inglis, and M. Côté, "Evaluation of the ac quantized Hall resistance," IEEE Trans. Instrum. Meas., vol. 46, pp. 269-272, 1997.
    • (1997) IEEE Trans. Instrum. Meas. , vol.46 , pp. 269-272
    • Wood, B.M.1    Inglis, A.D.2    Côté, M.3
  • 6
    • 0031120886 scopus 로고    scopus 로고
    • AC QHE-based calibration of resistance standards
    • J. Bohácek, p. Svoboda, and P. Vašek, "AC QHE-based calibration of resistance standards," IEEE Trans. Instrum. Meas., vol. 46, pp. 273-275, 1997.
    • (1997) IEEE Trans. Instrum. Meas. , vol.46 , pp. 273-275
    • Bohácek, J.1    Svoboda, P.2    Vašek, P.3
  • 7
    • 0029772990 scopus 로고    scopus 로고
    • Quantization test of a Hall device by ac measurements of the longitudinal resistance
    • Braunschweig, Germany
    • F. Cabiati, p. Capra, G. Marullo Reedtz, A. Sosso, and G. Rinaudo, "Quantization test of a Hall device by ac measurements of the longitudinal resistance," in CPEM'96 Dig., Braunschweig, Germany, 1996, pp. 255-256.
    • (1996) CPEM'96 Dig. , pp. 255-256
    • Cabiati, F.1    Capra, P.2    Marullo Reedtz, G.3    Sosso, A.4    Rinaudo, G.5
  • 8
    • 0026861396 scopus 로고
    • The quantum Hall effect and resistance standards
    • A. Hartland, "The quantum Hall effect and resistance standards," Metrologia, vol. 29, pp. 175-190, 1992.
    • (1992) Metrologia , vol.29 , pp. 175-190
    • Hartland, A.1
  • 9
    • 0007528668 scopus 로고    scopus 로고
    • Quantum Hall effect devices as circuit elements
    • B.W. Ricketts and P. C. Kemeny, "Quantum Hall effect devices as circuit elements," J. Phys. D Appl. Phys., vol. 21, pp. 483-487, 1998.
    • (1998) J. Phys. D Appl. Phys. , vol.21 , pp. 483-487
    • Ricketts, B.W.1    Kemeny, P.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.