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Volumn 54, Issue 7, 2006, Pages 1375-1377

Phase stability and thermal expansion property of FeSi2

Author keywords

FeSi2; Phase stability; Thermal expansion

Indexed keywords

PHASE TRANSITIONS; TEMPERATURE DISTRIBUTION; THERMAL EXPANSION; X RAY DIFFRACTION;

EID: 31544436333     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2005.11.076     Document Type: Article
Times cited : (18)

References (19)
  • 11
    • 31544442221 scopus 로고    scopus 로고
    • Tung RT, Maex K, Pellegrini PW, Allen LH, editors. Silicide thin films- fabrication, properties and applications Pittsburgh, PA: Materials Research Society
    • Lange H. In: Tung RT, Maex K, Pellegrini PW, Allen LH, editors. Silicide thin films- fabrication, properties and applications. 1996 MRS Symposia Proceedings No. 402. Pittsburgh, PA: Materials Research Society; 1996.
    • (1996) 1996 MRS Symposia Proceedings No. 402 , vol.402
    • Lange, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.