Posttreatment-dependent current degradation and role of tube length on morphology of printed carbon nanotube field emitters

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 44, Issue 24-27, 2005, Pages

  Kim, Yong Churl ^a   Sohn, Kwon Hee ^a   Cho, Young Mok ^a   Yoo, Eun Ho ^a  

^a LG Electronics Inc   (South Korea)

Author keywords

Carbon nanotube; Field emission; Post treatment; Vertical alignment

Indexed keywords

ACTIVATION ANALYSIS; ADHESIVES; CONTAMINATION; DEGRADATION; FIELD EMISSION DISPLAYS; MORPHOLOGY;

FIELD EMISSION; POST-TREATMENT; VERTICAL ALIGNMENT;

CARBON NANOTUBES;

EID: 31544435971     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.L848     Document Type: Article

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