Wavelet analysis for surface characterisation: An experimental assessment

CIRP Annals - Manufacturing Technology

Volumn 53, Issue 1, 2004, Pages 479-482

  Bruzzone, A A G ^a   Montanaro, J S ^a   Ferrando, A ^a   Lonardo, P M ^a  

^a UNIVERSITY OF GENOA   (Italy)

Author keywords

Roughness; Surface Analysis; Wavelet

Indexed keywords

DIGITAL FILTERS; FOURIER TRANSFORMS; MATHEMATICAL MODELS; SIGNAL PROCESSING; SURFACE TREATMENT; WAVELET TRANSFORMS;

SURFACE CHARACTERIZATION; SURFACE MICROGEOMETRY; WAVELET ANALYSIS;

SURFACE ROUGHNESS;

EID: 3142757950     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)60744-6     Document Type: Article

References (11)

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