The effect of secondary phases on electrical properties of ZnO-based ceramic films prepared by a sol-gel method

Journal of Materials Science: Materials in Electronics

Volumn 15, Issue 8, 2004, Pages 549-553

  Huang, Yanqiu ^a   Liu, Meidong ^b   Zeng, Yike ^b   Li, Churong ^b  

^a CHINA UNIVERSITY OF GEOSCIENCES   (China)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CERAMIC MATERIALS; DIFFUSION; ELECTRIC PROPERTIES; FILM PREPARATION; IONS; LATTICE CONSTANTS; SEMICONDUCTOR DOPING; THERMAL EFFECTS; VARISTORS; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

ANNEALING TEMPERATURE; FILM VARISTORS; SOL-GEL METHOD; ZINC OXIDE BASED CERAMIC FILMS;

SEMICONDUCTING FILMS;

EID: 3142753422     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JMSE.0000032590.38448.a2     Document Type: Article

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