Electrical characterisation of local electronic properties of self-assembled semiconductor nanostructures using AFM

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 23, Issue 3-4 SPEC. ISS., 2004, Pages 396-400

  Decossas, S ^a   Marchand, J J ^a   Bremond G ^a  

^a INSTITUT DES NANOTECHNOLOGIES DE LYON   (France)

Author keywords

AFM; Ge islands; IV IV semiconductors; KPFM; Nanostructure; SCM

Indexed keywords

ATOMIC FORCE MICROSCOPY; BAND STRUCTURE; CORRELATION METHODS; ELECTRIC PROPERTIES; GERMANIUM; MATRIX ALGEBRA; NANOSTRUCTURED MATERIALS; PHYSICAL PROPERTIES; WETTING;

GE ISLANDS; IV-IV SEMICONDUCTORS; KELVIN PROBE FORCE MICROSCOPY (KPFM); SCANNING CAPACITANCE MICROSCOPY (SCM);

SEMICONDUCTOR MATERIALS;

EID: 3142738730     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2004.02.006     Document Type: Conference Paper

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