Application of heat flow models to SOI current mirrors

Solid-State Electronics

Volumn 48, Issue 10-11 SPEC. ISS., 2004, Pages 1733-1739

  Yu, Feixia ^a   Cheng, Ming C ^a  

^a Clarkson University   (United States)

Author keywords

Characteristic thermal length; Current mirror; Interconnect; MOSFET; Silicon on insulator

Indexed keywords

COMPUTER SIMULATION; ENERGY DISSIPATION; HEAT CONDUCTION; MATHEMATICAL MODELS; MOSFET DEVICES; SUBSTRATES; TEMPERATURE DISTRIBUTION;

CURRENT MIRRORS; HEAT FLOW; THERMAL LENGTHS;

SILICON ON INSULATOR TECHNOLOGY;

EID: 3142717010     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2004.05.007     Document Type: Conference Paper

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