Thermal conductivity analysis and device performance of 1.55 μm InGaAlAs/InP buried tunnel junction VCSELs

Physica Status Solidi (A) Applied Research

Volumn 188, Issue 3, 2001, Pages 913-919

  Ortsiefer, M ^a   Shau, R ^a   Buhm G ^a   Kuhler F ^a   Rosskopf, J ^a   Amann, M C ^a  

^a WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

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Indexed keywords

EID: 3142684609     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200112)188:3<913::AID-PSSA913>3.0.CO;2-E     Document Type: Article

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