-
1
-
-
0000406346
-
Machining oxide films with an atomic force microscope: Pattern and objective formation on the nanometer scale
-
Kim Y, Lieber CM. Machining oxide films with an atomic force microscope: pattern and objective formation on the nanometer scale. Science, 1992, 257(5068): 375-377
-
(1992)
Science
, vol.257
, Issue.5068
, pp. 375-377
-
-
Kim, Y.1
Lieber, C.M.2
-
3
-
-
36449009033
-
Fabrication of two-dimensional arrays of nanometer-size clusters with the atomic force microscope
-
Schaefer DM, Reifenberger R, Patil A, et al. Fabrication of two-dimensional arrays of nanometer-size clusters with the atomic force microscope. Applied Physics Letters, 1995, 66: 1012-1014
-
(1995)
Applied Physics Letters
, vol.66
, pp. 1012-1014
-
-
Schaefer, D.M.1
Reifenberger, R.2
Patil, A.3
-
4
-
-
34249022469
-
Controlled manipulation of nanoparticles with an atomic force microscope
-
Junno T, Deppert K, Montelius L, et al. Controlled manipulation of nanoparticles with an atomic force microscope. Applied Physics Letters, 1995, 66(26): 3627-3629
-
(1995)
Applied Physics Letters
, vol.66
, Issue.26
, pp. 3627-3629
-
-
Junno, T.1
Deppert, K.2
Montelius, L.3
-
5
-
-
0031645825
-
Nanorobotic assembly of two-dimensional structures
-
Leuven, Belgium
-
Requicha AAG, Baur C, Bugacov A, et al. Nanorobotic assembly of two-dimensional structures. In: Proc IEEE Int. Conf. Robotics and Automation, Leuven, Belgium, May 1998. 3368-3374
-
(1998)
Proc. IEEE Int. Conf. Robotics and Automation
, pp. 3368-3374
-
-
Requicha, A.A.G.1
Baur, C.2
Bugacov, A.3
-
6
-
-
0001997274
-
A technique for positioning nanoparticles using an atomic force microscope
-
Hansen LT, Kuhle A, Sorensen AH, et al. A technique for positioning nanoparticles using an atomic force microscope. Nanotechnology, 1998, 9: 337-342
-
(1998)
Nanotechnology
, vol.9
, pp. 337-342
-
-
Hansen, L.T.1
Kuhle, A.2
Sorensen, A.H.3
-
7
-
-
0032651892
-
Three-dimensional manipulation of carbon nanotubes under a scanning electron microscope
-
Yu MF, Dyer MJ, Skidmore GD, et al. Three-dimensional manipulation of carbon nanotubes under a scanning electron microscope. Nanotechnology, 1999, 10: 244-252
-
(1999)
Nanotechnology
, vol.10
, pp. 244-252
-
-
Yu, M.F.1
Dyer, M.J.2
Skidmore, G.D.3
-
8
-
-
0034865899
-
3d nanorobotic manipulations of multi-walled carbon nanotubes
-
Seoul, Korea
-
Dong L, Arai F, Fukuda T. 3d nanorobotic manipulations of multi-walled carbon nanotubes. In: Proc IEEE Int Conf Robotics and Automation, Seoul, Korea, May 2001. 632-637
-
(2001)
Proc IEEE Int. Conf. Robotics and Automation
, pp. 632-637
-
-
Dong, L.1
Arai, F.2
Fukuda, T.3
-
9
-
-
0036056196
-
3d nanoassembly carbon nanotubes through nanorobotic manipulation
-
Washington DC, USA
-
Dong L, Arai F, Fukuda T. 3d nanoassembly carbon nanotubes through nanorobotic manipulation. In: Proc IEEE Int Conf Robotics and Automation, Washington DC, USA, May 2002. 1477-1482
-
(2002)
Proc IEEE Int. Conf. Robotics and Automation
, pp. 1477-1482
-
-
Dong, L.1
Arai, F.2
Fukuda, T.3
-
10
-
-
0034205024
-
Controlled manipulation of molecular samples with the nanomanipulator
-
Guthold M, Falvo MR, Matthews WG, et al. Controlled manipulation of molecular samples with the nanomanipulator. IEEE/ASME Transactions on Mechatronics, 2000, 5(2): 189-198
-
(2000)
IEEE/ASME Transactions on Mechatronics
, vol.5
, Issue.2
, pp. 189-198
-
-
Guthold, M.1
Falvo, M.R.2
Matthews, W.G.3
-
11
-
-
0032316482
-
Tele-nanorobotics using atomic force microscope
-
Victoria, BC, Canada
-
Sitti M, Hashimoto H. Tele-nanorobotics using atomic force microscope. In: Proc IEEE Int Conf Intelligent Robots and Systems, Victoria, BC, Canada, October 1998. 1739-1746
-
(1998)
Proc. IEEE Int. Conf. Intelligent Robots and Systems
, pp. 1739-1746
-
-
Sitti, M.1
Hashimoto, H.2
-
12
-
-
0006309372
-
The AFM as a tool for chromosomal dissection-the influence of physical parameter
-
Stark RW, Thalhammer S, Wienberg J, et al. The AFM as a tool for chromosomal dissection-the influence of physical parameter. Applied Physics A, 1998, 66: 579-584
-
(1998)
Applied Physics A
, vol.66
, pp. 579-584
-
-
Stark, R.W.1
Thalhammer, S.2
Wienberg, J.3
-
13
-
-
0033687326
-
Experimental and theoretical aspects of the modern nanotribology
-
Dedkov GV. Experimental and theoretical aspects of the modern nanotribology. Physical Status of Solid (a), 2000, 179: 3-75
-
(2000)
Physical Status of Solid (A)
, vol.179
, pp. 3-75
-
-
Dedkov, G.V.1
-
15
-
-
0033590561
-
Nanometer-scale rolling and sliding of carbon nanotubes
-
Falvo MR, Taylor RM, Helser A, et al. Nanometer-scale rolling and sliding of carbon nanotubes. Nature, 1999, 397: 236-238
-
(1999)
Nature
, vol.397
, pp. 236-238
-
-
Falvo, M.R.1
Taylor, R.M.2
Helser, A.3
-
16
-
-
0040375309
-
Correction for nonlinear behavior of piezoelectric tube scanners used in scanning tunneling and atomic force microscopy
-
Akila J, Wadhwa SS. Correction for nonlinear behavior of piezoelectric tube scanners used in scanning tunneling and atomic force microscopy. Review of Scientific Instruments, 1995, 66: 2517-2519
-
(1995)
Review of Scientific Instruments
, vol.66
, pp. 2517-2519
-
-
Akila, J.1
Wadhwa, S.S.2
-
17
-
-
0001024297
-
Optical scan-correction system applied to atomic force microscope
-
Barrett RC, Quate CF. Optical scan-correction system applied to atomic force microscope. Review of Scientific Instruments, 1991, 62: 1393-1399
-
(1991)
Review of Scientific Instruments
, vol.62
, pp. 1393-1399
-
-
Barrett, R.C.1
Quate, C.F.2
-
18
-
-
0002199949
-
Creep, hysteresis, and vibration compensation for piezoactuators: Atomic force microscopy application
-
Croft D, Shed G, Devasia S. Creep, hysteresis, and vibration compensation for piezoactuators: Atomic force microscopy application. ASME Transactions on Journal of Dynamic Systems, Measurement, and Control, 2001, 123: 35-43
-
(2001)
ASME Transactions on Journal of Dynamic Systems, Measurement, and Control
, vol.123
, pp. 35-43
-
-
Croft, D.1
Shed, G.2
Devasia, S.3
|