Sensitivity of surface free energy analysis methods to the contact angle changes attributed to the thickness effect in thin films

Journal of Applied Polymer Science

Volumn 93, Issue 4, 2004, Pages 1972-1980

  Abbasian, A ^a   Ghaffarian, S R ^a   Mohammadi, N ^a   Fallahi, D ^b  

^a AMIRKABIR UNIVERSITY OF TECHNOLOGY   (Iran)

^b IRAN POLYMER AND PETROCHEMICAL INSTITUTE   (Iran)

Author keywords

Epoxy; Films; Free energy; Surfaces; Tension

Indexed keywords

ADHESION; ADSORPTION; CONTACT ANGLE; FREE ENERGY; HARMONIC ANALYSIS; HYDROPHOBICITY; INTERFACIAL ENERGY; LUBRICATION; OXIDATION; POLARIZATION; SILICA; THERMAL STRATIFICATION; THICKNESS CONTROL; THIN FILMS; WETTING;

HARMONIC MEAN; OXIDIZED SILICA WAFERS; SURFACE FREE ENERGY ANALYSIS;

SURFACE TENSION;

POLYMER SCIENCE;

EID: 3142645171     PISSN: 00218995     EISSN: None     Source Type: Journal    
DOI: 10.1002/app.20672     Document Type: Article

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