Structure and magnetism of thin UX layers

Journal of Alloys and Compounds

Volumn 408-412, Issue , 2006, Pages 1320-1323

  Havela, L ^a   Miliyanchuk, K ^a   Rafaja, D ^b   Gouder, T ^c   Wastin, F ^c  

^a CHARLES UNIVERSITY   (Czech Republic)

^b TU BERGAKADEMIE FREIBERG   (Germany)

^c JOINT RESEARCH CENTRE   (Italy)

Author keywords

Magnetic measurements; Nanostructures; Thin films; X ray diffraction

Indexed keywords

ARGON; FERROMAGNETIC MATERIALS; MAGNETIC VARIABLES MEASUREMENT; MAGNETISM; NANOSTRUCTURED MATERIALS; SPUTTER DEPOSITION; X RAY DIFFRACTION;

BAND FERROMAGNETS; MAGNETIC MEASUREMENTS; REACTIVE SPUTTERING; THIN UX LAYERS;

THIN FILMS;

EID: 31344447024     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2005.04.125     Document Type: Conference Paper

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