Fine diffraction effects in Si single crystals implanted with fast Ar ions and annealed

Acta Physica Polonica A

Volumn 101, Issue 5, 2002, Pages 743-750

  Zymierska, D ^a   Godwod, K ^a   Adamczewska, J ^a   Auleytner, J ^a   Choinski J ^b   Reginski K ^c  

^a INSTITUTE OF PHYSICS   (Poland)

^b UNIVERSITY OF WARSAW   (Poland)

^c ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 31244433636     PISSN: 05874246     EISSN: None     Source Type: Journal    
DOI: 10.12693/APhysPolA.101.743     Document Type: Article

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