Characterisation by various microscopic techniques of the damage created by MeV C60 ions in amorphous Ni3B

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 146, Issue 1-4, 1998, Pages 222-232

  Dunlop, A ^a   Henry, J ^b   Jaskierowicz, G ^a  

^a LABORATOIRE DES SOLIDES IRRADIÉS   (France)

^b DIF   (France)

Author keywords

Amorphous targets; Anisotropic growth; Electronic excitation; Fullerene; Radiation damage; Transmission electron microscopy

Indexed keywords

AMORPHOUS MATERIALS; ANISOTROPY; ELECTRONIC PROPERTIES; FULLERENES; GROWTH (MATERIALS); NICKEL COMPOUNDS; PLASTIC DEFORMATION; RADIATION DAMAGE; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

ANISOTROPIC GROWTH; ELECTRONIC EXCITATION;

ION BOMBARDMENT;

EID: 0032477008     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00469-8     Document Type: Article

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