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Volumn 23, Issue 5, 2005, Pages 2232-2235

Pressure dependent Parylene-N pore sealant penetration in porous low- κ dielectrics

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION RATE; NUCLEAR REACTION ANALYSIS (NRA); PARYLENE;

EID: 31144463524     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2040427     Document Type: Conference Paper
Times cited : (16)

References (16)
  • 2
    • 84858523811 scopus 로고    scopus 로고
    • http:public.itrs.net, International Technology Roadmap for Semiconductors ed. 2003.
    • (2003)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.