Predication of multi-dimensional photonic crystal structures generated by multi-beam interference in holographic lithography

Smart Materials and Structures

Volumn 15, Issue 1, 2006, Pages

  Li, Enbang ^a,b   Xi, Jiangtao ^b   Chicharo, Joe ^b  

^a TIANJIN UNIVERSITY   (China)

^b UNIVERSITY OF WOLLONGONG   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; LITHOGRAPHY; OPTICAL PROPERTIES; PHOTONS; POLARIZATION;

BEAM INTENSITIES; MULTI-BEAM INTERFERENCE; PHOTONIC CRYSTALS;

CRYSTALLINE MATERIALS;

EID: 31144455469     PISSN: 09641726     EISSN: 1361665X     Source Type: Journal    
DOI: 10.1088/0964-1726/15/1/026     Document Type: Conference Paper

References (16)

1. Yablonovitch E 1993 J. Opt. Soc. Am. B 10 283
2. Sozuer H S and Haus J W 1993 J. Opt. Soc. Am. B 10 296
3. Lin S Y, Chow E, Hietala V, Villeneuve P R and Joannopoulos J D 1998 Science 282 274
4. Andreani L C and Agio M 2002 IEEE J. Quantum Electron. 38 891
5. LI Z-Y, El-Kady I and Ho K-M 2003 J. Appl. Phys. 93 38
6. Chutinan A and Noda S 1999 Appl. Phys. Lett. 75 3739
7. Schilling J, Muller F, Matthias S, Wehrspohn R B and Gosele U 2001 Appl. Phys. Lett. 78 1180
8. Talneau A, Le Gouezigou L, Bouadma N, Kafesaki M, Soukoulis C M and Agio M 2002 Appl. Phys. Lett. 80 547
9. Noda S, Imada M, Okano M, Ogawa S, Mochizuki M and Chutinan A 2002 IEEE J. Quantum Electron. 38 726
10. Bogaerts W, Wiaux V, Taillaert D, Beckx S, Luyssaert B, Bienstman P and Baets R 2002 IEEE J. Sel. Top. Quantum Electron. 8 928
11. Sun H-B, Matsuo S and Misawa H 1999 Appl. Phys. Lett. 74 786
12. Campbell M, Sharp D N, Harrison M T, Denning R G and Turberfield A J 2000 Nature 404 53
13. Kondo T, Matsuo S, Juodkazis S and Misawa H 2001 Appl. Phys. Lett. 79 725
14. Divliansky I B, Shishido A, Khoo I-C, Pena D, Nishimura S, Keating C D and Mallouk T E 2001 Appl. Phys. Lett. 79 3392
15. Divliansky I, Mayer T S, Holliday K S and Crespi V H 2003 Appl. Phys. Lett. 82 1667
16. Wang X, Xu J F, Su H M, Zeng Z H, Chen Y L and Wang H Z 2003 Appl. Phys. Lett. 82 2212