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Volumn 23, Issue 1, 2005, Pages 72-77
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Preparation and characterization of atomically clean, stoichiometric surfaces of AIN(0001)
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Author keywords
[No Author keywords available]
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Indexed keywords
OXYGENHYDROXIDE;
VACUUM ANNEALING;
AMMONIA;
ANNEALING;
ELECTRON DIFFRACTION;
HYDROCARBONS;
MICROSTRUCTURE;
STOICHIOMETRY;
SURFACE CHEMISTRY;
TEMPERATURE DISTRIBUTION;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ALUMINUM NITRIDE;
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EID: 31144446546
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1830497 Document Type: Article |
Times cited : (9)
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References (11)
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