Phase characterization of two-tone intermodulation distortion

IEEE MTT-S International Microwave Symposium Digest

Volumn 2005, Issue , 2005, Pages 1505-1508

  Crespo Cadenas, C ^a   Reina Tosina, J ^a   Madero Ayora, M J ^a  

^a UNIVERSIDAD DE SEVILLA   (Spain)

Author keywords

Amplifier distortion; Electrical memory effects; IM products; Phase asymmetries; Two tone test setup; Volterra series

Indexed keywords

AMPLIFIERS (ELECTRONIC); HIGH ELECTRON MOBILITY TRANSISTORS; INTERMODULATION; MICROWAVE CIRCUITS; NATURAL FREQUENCIES; SIGNAL GENERATORS;

ELECTRICAL MEMORY EFFECTS; IM PRODUCTS; PHASE ASYMMETRIES; TWO TONE TEST SETUP; VOLTERRA SERIES;

SIGNAL DISTORTION;

EID: 31044454177     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2005.1516979     Document Type: Conference Paper

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