Infrared ellipsometry of interdiffusion in thin films of miscible polymers

Surface and Interface Analysis

Volumn 37, Issue 1, 2005, Pages 33-41

  Duckworth, P ^a   Richardson, H ^a   Carelli, C ^a   Keddie, J L ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Diffusion; Ellipsometry; Infrared; Interfaces; Miscible; PMMA; PVDF; Thin films

Indexed keywords

CONCENTRATION (PROCESS); ELLIPSOMETRY; INFRARED RADIATION; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); POLYMETHYL METHACRYLATES;

BULK MATERIALS; CONCENTRATION GRADIENT; DATA MODELING; POLYMER SYSTEMS;

THIN FILMS;

EID: 11844279106     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.2003     Document Type: Article

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