Interferometric characterization and analysis of silver-exchanged glass waveguides buried by electromigration: Slab, channel and slab-sided channel configurations

Journal of Optics A: Pure and Applied Optics

Volumn 8, Issue 2, 2006, Pages 123-133

  Blanco, X Prieto ^a  

^a UNIVERSITY OF SANTIAGO DE COMPOSTELA   (Spain)

Author keywords

Electromigration; Field assisted diffusion; Glass; Iion exchange; Integrated optics; Interference microscopy

Indexed keywords

ELECTROMIGRATION; GLASS; INTERFEROMETRY; ION EXCHANGE; LIGHT EMITTING DIODES; PHOTOLITHOGRAPHY; SILVER;

FIELD-ASSISTED DIFFUSION; IION-EXCHANGE; INTERFERENCE MICROSCOPY; WAVEGUIDE GRATINGS;

WAVEGUIDES;

EID: 31044433479     PISSN: 14644258     EISSN: 17413567     Source Type: Journal    
DOI: 10.1088/1464-4258/8/2/004     Document Type: Article

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