Concentration profile calculation for buried ion-exchanged channel waveguides in glass using explicit space-charge analysis

IEEE Journal of Quantum Electronics

Volumn 37, Issue 4, 2001, Pages 606-612

  Hazart, Jerome ^a   Minier, V ^a  

^a Groupement d'Electromagnétisme Expérimental et d'Optoélectronique GeeO   (France)

Author keywords

Diffused ion exchanged waveguides; Field assisted ion exchange; Integrated optics; Mixed alkali effect; Nonlinear diffusion simulation; Theory of ion exchange in glass

Indexed keywords

ALGORITHMS; CALCULATIONS; COMPUTER SIMULATION; CURRENT DENSITY; DIFFUSION; ELECTRIC SPACE CHARGE; INTEGRATED OPTICS; IONIC CONDUCTION; OPTICAL GLASS; WAVEGUIDES;

CONCENTRATION PROFILE CALCULATION; FIELD-ASSISTED BURYING; ION-EXCHANGED CHANNEL WAVEGUIDE; NONLINEAR IONIC DIFFUSIVITY; SPACE CHARGE EVOLUTION EQUATION;

QUANTUM ELECTRONICS;

EID: 0035310546     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.914411     Document Type: Article

References (14)

1. Ion exchange on glass substrates: Numerical determination of concentration profiles
2. Migration of two ions during electrolysis of glass waveguide
3. Numerical modeling of 2-D field assisted ion-exchange in glass
4. Simulation of field-assisted ion exchange for glass channel waveguide fabrication: Effect of nonhomogeneous time-dependent electric conductivity
5. Ion exchange on glass substrates: Influence of the mixed cation effect on concentration profiles
6. Characterization of ion-exchanged glasses for application in integrated optics
7. Sparse matrices in MATLAB: Design and implementation
8. Modeling of graded-index channel waveguides using nonuniform finite difference method
9. Modeling ion exchange in glass with concentration-dependent diffusion coefficients and mobilities
10. Distributed-index formation process in a planar microlens
11. 2O)