Modeling and interference-microscopy characterization of graded index transitions in ion-exchange waveguide integrated elements: transitions between annealed surfaces

Optical and Quantum Electronics

Volumn 32, Issue 11, 2000, Pages 1269-1281

  Lopez Lago, E ^a   Linares J ^a   Salmio, R P ^b   Saarinen, J ^c   Kuittinen, M ^d   Turunen, J ^d   Vahimaa, P ^e  

^a UNIVERSITY OF SANTIAGO DE COMPOSTELA   (Spain)

^b MCKINSEY AND COMPANY   (United States)

^c AALTO UNIVERSITY   (Finland)

^d UNIVERSITY OF EASTERN FINLAND   (Finland)

^e Heptagon Oy   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIFFUSION; GRADIENT INDEX OPTICS; INTEGRATED OPTICS; INTERFEROMETRY; ION EXCHANGE; LIGHT INTERFERENCE; LIGHT PROPAGATION; OPTICAL MICROSCOPY; REFRACTIVE INDEX; SINGLE MODE FIBERS;

INTERFERENCE MICROSCOPY; MICROINTERFEROMETRY; SINGLE MODE PROPAGATION; WAVEGUIDE INTEGRATED ELEMENTS;

OPTICAL WAVEGUIDES;

EID: 0342521536     PISSN: 03068919     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1007087817512     Document Type: Article

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