Radial temperature profiling of VCSELs

2005 Conference on Lasers and Electro-Optics, CLEO

Volumn 2, Issue , 2005, Pages 1378-1380

  Lüerßen, Dietrich ^a,b   Ram, Rajeev J ^b   Hudgings, Janice ^a  

^a MOUNT HOLYOKE COLLEGE   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION TEMPERATURE MEASUREMENT; RADIAL SURFACE TEMPERATURE;

ION IMPLANTATION; LENSES; PROTONS; SURFACES;

OPTICAL RESOLVING POWER;

EID: 30944465078     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. J. Piprek. et al. Analysis of Temperature Measurements on Vertical-Cavity Surface-Emitting Lasers, in CLEO '95. Conference on Lasers and Electro-Optics, 22-26 May 1995. 1995. Baltimore, MD, USA: Opt. Soc. America.
2. M. Dabbicco, et al., "Experimental Determination of the Temperature Distribution in Trench-Confined Oxide Vertical-Cavity Surface-Emitting Lasers," IEEE Journal of Quantum Electronics 39(6): p. 701-707 (2003).
3. M. Dabbicco, et al. Non-Destructive Technique for the Direct Measurement of the Local Temperature Distribution in Vcsels. in Test and Measurement Applications of Optoelectric Devices, Jan 21-22 2002. 2002. San Jose, CA, United States: The International Society for Optical Engineering.
4. K. Luo, et al., "Scanning Thermal Microscopy of a Vertical-Cavity Surface-Emitting Laser." Applied Physics Letters 71(12): p. 1604-1606 (1997).
5. D. Lüerßen, et al. "Nanoscale Tliermo-Reflectance Microscopy with 10mK Temperature Resolution Using Stochastic Resonance". To be presented at 21 st Semi-Therm, 2005. San Jose.
6. J.A. Tatum, et al. High-Speed Characteristics of VCSELs. in Fabrication, Testing, and Reliability of Semiconductor Lasers, I. Feb 13-14 97. 1997, San Jose, CA, USA: Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, USA.
7. S. Grauby, et al., "High Resolution Photothermal Imaging of High Frequency Phenomena Using a Visible Charge Coupled Device Camera Associated with a Multichannel Lock-in Scheme," Review of Scientific Intruments 70(9): p. 3603-3608 (1999).
8. S. Dilhaire, S. Grauby, and W. Claeys, "Calibration Procedure for Temperature Measurements by Thermoreflectance under High Magnification Conditions," Applied Physics Letters 84(5): p. 822-824 (2004).