Nanoinclusions in dry polymer brushes

Macromolecules

Volumn 39, Issue 1, 2006, Pages 413-425

  Kim, Jaeup U ^a   O'Shaughnessy, Ben ^a  

^a Columbia University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHAIN FLUCTUATION SCALE; DRY POLYMER BRUSHES; NANOINCLUSIONS; SELF-CONSISTENT MEAN FIELD (SCF) THEORY;

ASPECT RATIO; BLOCK COPOLYMERS; BRUSHES; FREE ENERGY;

NANOSTRUCTURED MATERIALS;

EID: 30944459514     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma050817i     Document Type: Article

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