Optical properties of polymer-based photonic nanocomposite materials

Journal of Physical Chemistry B

Volumn 107, Issue 37, 2003, Pages 10017-10024

  Bockstaller, Michael R ^a   Thomas, Edwin L ^a  

^a Massachusetts Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BLOCK COPOLYMERS; CALCULATIONS; GOLD; LIGHT REFLECTION; OPTICAL PROPERTIES; POLYPROPYLENES; POLYSTYRENES; THIN FILMS;

DIELECTRIC FUNCTION; GOLD NANOCRYSTALS; MULTILAYERED METALLODIELECTRIC BRAGG REFLECTORS; PHOTONIC APPLICATIONS; PHOTONIC NANOCOMPOSITE MATERIALS; REFLECTOMETRY;

NANOSTRUCTURED MATERIALS;

EID: 0141459283     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp035286j     Document Type: Article

References (40)

1. Yablonovitch, E. Phys. Rev. Lett. 1987, 58, 2059-2062.
2. John, S. Phys. Rev. Lett. 1987, 58, 2486-2489.
3. Fink, J.; Winn, J. N.; Fan, S.; Chen, C.; Michel, J.; Joannopoulos, J. D.; Thomas, E. L. Science 1998, 282, 1679-1682.
4. Berger, V. Curr. Opin. Solid State Mater. Sci. 1999, 4, 209-216.
5. Edrington, A. C.; Urbas, A. M.; DeRege, P.; Chen, X. C.; Swager, T. M.; Hadjichristidis, N.; Xendiou, M.; Fetters, L. J.; Joannopoulos, J. D.; Fink, Y.; Thomas, E. L. Adv. Mater. 2001, 13, 421-424.
6. Urbas, A. M.; Maldovan, M.; Carter, C.; Yufa, N.; Thomas, E. L. Adv. Mater. 2002, 14, 1853-1856.
7. Richards, H. B. Eur. J. Inorg. Chem. 2001, 2455-2480.
8. El-Sayed, M. A. Acc. Chem. Res. 2001, 34, 257-264.
9. Bockstaller, M. R.; Kolb, R.; Thomas, E. L. Adv. Mater. 2001, 13, 1783-1786.
10. Choy, T. C. Effective Medium Theory; Oxford University Press: Oxford, U.K., 1999.
11. Simon, R.; Ulrich, P. Colloid Polym. Sci. 1999, 277, 2-14.
12. Smith, D. D.; Snow, L. A.; Sibille, L.; Ignont, E. J. Non-Cryst. Solids 2001, 285, 256-263.
13. Brust, M.; Bethell, D.; Schiffrin, D. J.; Whyman, R. J. Chem. Soc., Chem. Commun. 1994, 801-802.
14. Kiely, C. J.; Fink, J.; Brust, M.; Bethell, D.; Schiffrin, D. J. Nature 1998, 396, 444-446.
15. Antonietti, M.; Forster, S.; Hartmann, J.; Oestreich, S.; Wenz, E. Nachr. Chem. Tech. Lab. 1996, 44, 579.
16. Qu, S.; Du, C.; Wang, Y.; Gao, Y.; Liu, S.; Liu, Y.; Zhu, D. Opt. Commun. 2001, 196, 317-323.
17. Bockstaller, M. R.; Lapetnikov, Y.; Margel, S.; Thomas, E. L. J. Am. Chem. Soc. 2003, 125, 5276-5277.
18. Cohen, R. E. Curr. Opin. Solid State Mater. Sci. 1999, 4, 587-590.
19. Cohen, R. E. In Polymeric Materials; Salamone, J. C., Ed.; CRC Press: Boca Raton, FL, 1996; Vol. 6, pp 4143-4149.
20. Born, M.; Wolf, M. Theory of optics; Cambridge University Press: London, 2000.
21. Palik, E. D. Handbook of Optical Constants of Solids; Academic Press: San Diego, CA, 1998; Vol. 1.
22. Maldovan, M.; Bockstaller, R. M.; Thomas, E. L.; Carter, C. Appl. Phys. B 2003, 76, 877-884.
23. Woolham, J. A.; Bungay, C. L.; Synowicki, R. A.; Tiwald, T. E.; Thompson, T. W. In Characterization and Metrology for ULSI Technology, 2000: International Conference, Gaithersburg, Maryland, 26-29 June 2000; Seiler, D. G., Shaffner, T. J., McDonald, R., Bullis, W. M., Smith P. J., Secula, E. M., Eds.; American Institute of Physics: Melville, NY, 2001; Vol. CP550, pp 511-518.
24. Herzinger, C. M.; Johs, B. D. U.S. Patent 5,796,983, August 18, 1998.
25. Johs, B.; Herzinger, C. M.; Hilfiker, J.; Synowicki, R.; Bungay, C. L. In Optical Metrology; Society of Photo-Optical Instrumentation Engineers: Denver, CO, 1999; Vol. CR72, pp 29-58.
26. Jellison, G. E. Opt. Mater. 1992, 1, 41.
27. Garnett, J. C. M. Philos. Trans. R. Soc. 1904, 203, 385-420.
28. Garnett, J. C. M. Philos. Trans. R. Soc. 1906, 205, 237.
29. To test the reliability of the ellipsometric results, we independently determined the film thickness of all samples by profilometry, and the values obtained with both methods were found to agree within the range of experimental error (see Supporting Information, Figure S1).
30. Whetten, R. L.; Khoury, J. T.; Alvarez, M. M.; Murthy, S.; Vezmar I.; Wang, Z. L.; Stephens, P. W.; Cleveland, C. L.; Luedtke, W. D.; Landman, U. Adv. Mater. 1996, 8, 428-431.
31. Alvarez, M. M.; Khoury, T. J.; Schaaff, G. T.; Shafigullin, M. N.; Vezmar, I.; Whetten, R. L. J. Phys. Chem. B 1997, 101, 3706-3712.
32. Bigioni, T. P.; Whetten, R. L.; Dag, O. J. Phys. Chem. B 2000, 104, 6983-6986.
33. Fragstein, U.; Kreibig, U. Z. Phys. 1969, 224, 307-323.
34. Kawabata, A.; Kubo, R. J. Phys. Soc. Jpn. 1966, 21, 1765.
35. Quinten, M. Z. Phys. B 1996, 101, 211-217.
36. Kreibig, U. Z. Phys. 1970, 234, 307-318.
37. Vollmer, U.; Kreibig, U. Optical Properties of Metal Clusters; Springer-Verlag: Berlin, Heidelberg, New York, 1995; Vol. 1.
38. Fenter, P.; Eberhardt, A.; Eisenberger, P. Science 1994, 266, 1216-1218.
39. 0 represents the respective lamellar thickness.
40. core = 42 nm (see Supporting Information, Figure S2).