Test of Significance Based on Wavelet Thresholding and Neyman's Truncation

Journal of the American Statistical Association

Volumn 91, Issue 434, 1996, Pages 674-688

  Fan, Jianqing ^a  

^a University of North Carolina at Chapel Hill   (United States)

Author keywords

Adaptive Neyman test; Goodness of fit; Hard thresholding parameter; Soft thresholding parameter; Two sample test; Wavelet thresholding

Indexed keywords

EID: 0030549054     PISSN: 01621459     EISSN: 1537274X     Source Type: Journal    
DOI: 10.1080/01621459.1996.10476936     Document Type: Article

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