Testing process capability based on Cpm in the presence of random measurement errors

Journal of Applied Statistics

Volumn 32, Issue 10, 2005, Pages 1003-1024

  Pearn, W L ^a   Shu, M H ^b   Hsu, B M ^c  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL KAOHSIUNG UNIVERSITY OF APPLIED SCIENCES   (Taiwan)

^c CHENG SHIU UNIVERSITY   (Taiwan)

Author keywords

Critical value; Gauge measurement error; Lower confidence bound; Process capability analysis

Indexed keywords

EID: 30844458796     PISSN: 02664763     EISSN: None     Source Type: Journal    
DOI: 10.1080/02664760500164951     Document Type: Article

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