Measuring process yield based on the capability index Cpm

International Journal of Advanced Manufacturing Technology

Volumn 24, Issue 7-8, 2004, Pages 503-508

  Pearn, W L ^a   Lin, P C ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Nonconformities; Process capability index; Process yield

Indexed keywords

CAPABILITY ANALYSIS; CAPABILITY INDICES; INDEX VALUES; LOWER BOUNDS; MANUFACTURING INDUSTRIES; NONCONFORMITIES; PROCESS CAPABILITIES; PROCESS CAPABILITY INDICES; PROCESS YIELD;

PROCESS CONTROL; PRODUCTION ENGINEERING;

INDUSTRIAL ENGINEERING;

EID: 27944471573     PISSN: 02683768     EISSN: 14333015     Source Type: Journal    
DOI: 10.1007/s00170-003-1586-1     Document Type: Article

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