Applications of highly oriented pyrolytic graphite (HOPG) for x-ray diagnostics and spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5918, Issue , 2005, Pages 1-11

  Legall, H ^a   Stiel, H ^a   Nickles, P V ^a   Bjeoumikhov, A A ^c   Langhoff, N ^c   Haschke, M ^c   Arkadiev, V A ^b   Wedell, R ^b  

^a MAX BORN INSTITUT   (Germany)

^b LEIBNIZ INSTITUT FÜR KATALYSE E V AN DER UNIVERSITÄT ROSTOCK   (Germany)

^c Institute for Scientific Instruments GmbH   (Germany)

Author keywords

Crystal spectrometer; EXAFS; Highly Oriented Pyrolytic Graphite (HOPG); X ray absorption spectroscopy; X ray plasma diagnostics

Indexed keywords

ABSORPTION SPECTROSCOPY; OPTICAL RESOLVING POWER; PLASMA DIAGNOSTICS; PYROLYSIS; THIN FILMS; X RAY ANALYSIS; X RAY SPECTROSCOPY;

CRYSTAL SPECTROMETER; HIGHLY ORIENTED PYROLYTIC GRAPHITE (HOPG); X-RAY ABSORPTION SPECTROSCOPY (XRAS); X-RAY PLASMA DIAGNOSTICS;

GRAPHITE;

EID: 30844452436     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.614847     Document Type: Conference Paper

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