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Journal of Electron Spectroscopy and Related Phenomena

Volumn 101-103, Issue , 1999, Pages 565-571

Soft X-ray fluorescence measurements of irradiated polyimide and polycarbosilane films

(9) Kurmaev, E Z a Winarski, R P b Ederer, D L b Pivin, J C c Shamin, S N a Moewes, A d Callcott, T A e Chang, G S f Whang, C N f

a INSTITUTE OF METAL PHYSICS (Russian Federation)

b Tulane University (United States)

c 91405 Orsay Campus (France)

d LOUISIANA STATE UNIVERSITY (United States)

e UNIVERSITY OF TENNESSEE (United States)

f Yonsei University (South Korea)

Author keywords

Bonding configurations of atoms; Irradiated polymer films; X ray fluorescence spectra

Indexed keywords

EID: 30744469102 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/s0368-2048(98)00353-3 Document Type: Article

Times cited : (1)

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