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Volumn 32, Issue 3, 2005, Pages 187-192

N-type multicrystalline silicon wafers and rear junction solar cells

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYING; ANNEALING; CRYSTAL IMPURITIES; CRYSTALLINE MATERIALS; DIFFUSION; PHOSPHORUS; SOLAR CELLS;

EID: 30544438231     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap:2005085     Document Type: Article
Times cited : (7)

References (14)
  • 2
    • 0004192386 scopus 로고    scopus 로고
    • Metal impurities in silicon device fabrication
    • Springer, Berlin
    • K. Graff, Metal Impurities in Silicon Device Fabrication, Springer Series in Materials 24 (Springer, Berlin, 2000)
    • (2000) Springer Series in Materials , vol.24
    • Graff, K.1
  • 7
    • 30544448214 scopus 로고    scopus 로고
    • C. Schrniga, J. Schmidt, M. Ghosh. A. Metz, R. Hezel, in Ref. [3], p. 1060
    • C. Schrniga, J. Schmidt, M. Ghosh. A. Metz, R. Hezel, in Ref. [3], p. 1060
  • 8
    • 30544452476 scopus 로고    scopus 로고
    • J. Libal, T. Buck, R. Kopecek, P. Fath, K. Wambach, A. Acciari, S. Binetti, L.T. Geerligs, in Ref. [3], p. 1013
    • J. Libal, T. Buck, R. Kopecek, P. Fath, K. Wambach, A. Acciari, S. Binetti, L.T. Geerligs, in Ref. [3], p. 1013
  • 10
    • 30544440575 scopus 로고    scopus 로고
    • D.L. Meier, J.A. Jessup, P. Hacke, S. Granata Jr., N. Ishikawa, M. Emoto, in Ref. [3], p. 100
    • D.L. Meier, J.A. Jessup, P. Hacke, S. Granata Jr., N. Ishikawa, M. Emoto, in Ref. [3], p. 100


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.