Corrosion at the grain boundary and a fluorine-related passivation layer on etched AI-Cu (1 %) alloy surfaces

ETRI Journal

Volumn 21, Issue 3, 1999, Pages 16-20

  Baek, Kyu Ha ^a,b   Yoon, Yong Sun ^c   Park, Jong Moon ^c   Kwon, Kwang Ho ^c   Kim, Chang Il ^c   Nam, Kee Soo ^c  

^a Yonsei University   (South Korea)

^b Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3042971049     PISSN: 12256463     EISSN: None     Source Type: Journal    
DOI: 10.4218/etrij.99.0199.0303     Document Type: Article

References (14)

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