Size effects on exchange bias in sub-100 nm ferromagnetic-antiferromagnetic dots deposited on prepatterned substrates

Applied Physics Letters

Volumn 84, Issue 24, 2004, Pages 4923-4925

  Baltz, V ^a   Sort, J ^a   Rodmacq, B ^a   Dieny, B ^a   Landis, S ^b  

^a CEA GRENOBLE   (France)

^b CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; COMPOSITION; MAGNETIC ANISOTROPY; MAGNETIC DOMAINS; MAGNETIC HYSTERESIS; MAGNETIZATION; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; REMANENCE; SILICON; SUBSTRATES;

BLOCKING TEMPERATURES; EXCHANGE BIAS; EXCHANGE COUPLED MATERIALS; PREPATTERNED SUBSTRATES;

FERROMAGNETIC MATERIALS;

EID: 3042858774     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1757646     Document Type: Article

References (32)

1. For recent reviews on exchange bias, see J. Nogués and I. K. Schuller, J. Magn. Magn. Mater. 192, 203 (1999); A. E. Berkowitz and K. Takano, ibid. 200, 552 (1999); R. L. Stamps, J. Phys. D 33, R247 (2000); M. Kiwi, J. Magn. Magn. Mater. 234, 584 (2001).
2. For recent reviews on exchange bias, see J. Nogués and I. K. Schuller, J. Magn. Magn. Mater. 192, 203 (1999); A. E. Berkowitz and K. Takano, ibid. 200, 552 (1999); R. L. Stamps, J. Phys. D 33, R247 (2000); M. Kiwi, J. Magn. Magn. Mater. 234, 584 (2001).
3. For recent reviews on exchange bias, see J. Nogués and I. K. Schuller, J. Magn. Magn. Mater. 192, 203 (1999); A. E. Berkowitz and K. Takano, ibid. 200, 552 (1999); R. L. Stamps, J. Phys. D 33, R247 (2000); M. Kiwi, J. Magn. Magn. Mater. 234, 584 (2001).
4. For recent reviews on exchange bias, see J. Nogués and I. K. Schuller, J. Magn. Magn. Mater. 192, 203 (1999); A. E. Berkowitz and K. Takano, ibid. 200, 552 (1999); R. L. Stamps, J. Phys. D 33, R247 (2000); M. Kiwi, J. Magn. Magn. Mater. 234, 584 (2001).
5. D. Mauri, H. C. Siegmann, P. S. Bagus, and E. Kay, J. Appl. Phys. 62, 3047 (1987).
6. A. P. Malozemoff, Phys. Rev. B 35, 3679 (1987).
7. M. Kiwi, J. Mejía-López, R. D. Portugal, and R. Ramírez, Europhys. Lett. 48, 573 (1999).
8. M. Fraune, U. Rüdiger, G. Güntherodt, S. Cardoso, and P. Freitas, Appl. Phys. Lett. 77, 3815 (2000).
9. J. Yu, A. D. Kent, and S. S. P. Parkin, J. Appl. Phys. 87, 5049 (2000).
10. Y. Shen, Y. Wu, H. Xie, K. Li, J. Qiu, and Z. Guo, J. Appl. Phys. 91, 8001 (2002).
11. A. Hoffman, M. Grimsditch, J. E. Pearson, J. Nogués, W. A. A. Macedo, and I. K. Schuller, Phys. Rev. B 67, 220406 (2003).
12. Z. B. Guo, K. B. Li, G. C. Han, Z. Y. Liu, P. Luo, and Y. H. Wu, J. Magn. Magn. Mater. 251, 323 (2002).
13. E. Girgis, R. D. Portugal, H. Loosvelt, M. J. Van Bael, I. Gordon, M. Malfait, K. Temst, C. Van Haesendonck, L. H. A. Leunissen, and R. Jonckheere, Phys. Rev. Lett. 91, 187202 (2003).
14. B. Dieny, V. S. Speriosu, S. S. P. Parkin, B. A. Gurney, D. R. Wilhoit, and D. Mauri, Phys. Rev. B 43, 1297 (1991).
15. K. Liu, J. Nogués, C. Leighton, H. Masuda, K. Nishio, I. V. Roshchin, and I. K. Schuller, Appl. Phys. Lett. 81, 4434 (2002).
16. V. Skumryev, S. Stoyanov, Y. Zhang, G. Hadjipanayis, D. Givord, and J. Nogués, Nature (London) 423, 850 (2003).
17. S. Tehrani, J. M. Slaughter, M. Deherrera, B. N. Engel, N. D. Rizzo, J. Slater, M. Durlam, R. W. Dave, J. Janesky, B. Butcher, K. Smith, and G. Grynkewich, Proc. IEEE 91, 703 (2003).
18. S. Landis, B. Rodmacq, B. Dieny, B. Dal'Zotto, S. Tedesco, and M. Heitz-mann, Appl. Phys. Lett. 75, 2473 (1999); S. Landis, B. Rodmacq, and B. Dieny, Phys. Rev. B 62, 12271 (2000).
19. S. Landis, B. Rodmacq, B. Dieny, B. Dal'Zotto, S. Tedesco, and M. Heitz-mann, Appl. Phys. Lett. 75, 2473 (1999); S. Landis, B. Rodmacq, and B. Dieny, Phys. Rev. B 62, 12271 (2000).
20. J. Sort, H. Glaczynska, U. Ebels, M. Giersig, J. Rybczynski, and B. Dieny, J. Appl. Phys. (in press).
21. For a recent review on the fabrication and properties of magnetic nano - structures, see: J. I. Martin, J. Nogués, K. Liu, J. L. Vicent, and I. K. Schuller, J. Magn. Magn. Mater. 256, 449 (2003).
22. P. Miltényi, M. Gierlings, J. Keller, B. Beschoten, G. Güntherodt, U. Nowak, and K. D. Usadel, Phys. Rev. Lett. 84, 4224 (2000).
23. D. Suess, T. Schrefl, W. Scholz, J. V. Kim, R. L. Stamps, and J. Fidler, IEEE Trans. Magn. 38, 2397 (2002).
24. M. J. Carey, N. Smith, B. A. Gurney, J. R. Childress, and T. Lin, J. Appl. Phys. 89, 6579 (2001).
25. S. Soeya, S. Nakamura, T. Imagawa, and S. Narishige, J. Appl. Phys. 77, 5838 (1995).
26. T. Ambrose and C. L. Chien, J. Appl. Phys. 83, 6822 (1998).
27. A. J. Devasahayam and M. H. Kryder, J. Appl. Phys. 85, 5519 (1999).
28. C. Tsang and K. Lee, J. Appl. Phys. 53, 2605 (1982).
29. For a recent review on magnetic properties of fine particle systems, see: X. Batlle and A. Labarta, J. Phys. D 35, R15 (2002).
30. F. Huang, M. T. Kief, G. J. Mankey, and R. F. Willis, Phys. Rev. B 49, 3962 (1994).
31. F. Bødker and S. Mørup, Europhys. Lett. 52, 217 (2000).
32. W. H. Zhong, C. Q. Sun, B. K. Tay, S. Li, H. L. Bai, and E. Y. Jiang, J. Phys.: Condens. Matter 14, L399 (2002).