Micromagnetic simulation of antiferromagnetic/ferromagnetic structures

IEEE Transactions on Magnetics

Volumn 38, Issue 5 I, 2002, Pages 2397-2399

  Suess, D ^a   Schrefl, T ^a   Scholz, W ^a   Kim, J V ^b   Stamps, R L ^b   Fidler, J ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

Antiferromagnetic (AF) domain structure; Antiferromagnets; Exchange bias; Finite element method; Micromagnetics

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; FINITE ELEMENT METHOD; MAGNETIZATION; POLYCRYSTALLINE MATERIALS; PROBLEM SOLVING;

CONTINUUM THEORY;

FERROMAGNETIC MATERIALS;

EID: 0036761660     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2002.803594     Document Type: Article

References (4)

1. T.C. Schulthess and W.H. Butler, "Consequences of spin-flop coupling in exchange biased films," Phys. Rev. Lett., vol. 81, pp. 4516-4519, 1998.
2. N.C. Koon, "Calculations of exchange bias in thin films with F/AF interfaces," Phys. Rev. Lett., vol. 78, pp, 4865-4868, 1997.
3. J.-V. Kim, R.L. Stamps, B.V. McGrath, and R.E. Camley, "Angular dependence and interfacial roughness in exchange-biased F/AF bilayers," Phys. Rev. B, vol. 61, p. 8888, 2000.
4. A.E. Berkowitz and K. Takano, "Exchange anisotropy-A review," J. Magn. Magn. Mater., vol. 200, pp. 552-570, 1999.