-
1
-
-
0030192752
-
Breakdown of thin gate silicon dioxide films - A review
-
Nafria M., Sune J., Ayermich X. Breakdown of thin gate silicon dioxide films - a review. Microelectron. Reliab. 36:1996;871-905.
-
(1996)
Microelectron. Reliab.
, vol.36
, pp. 871-905
-
-
Nafria, M.1
Sune, J.2
Ayermich, X.3
-
2
-
-
0035393116
-
Ultra-thick gate oxides: Charge generation and its impact on reliability
-
Schwalke U., Pölzl M., Sekinger T., Kerber M. Ultra-thick gate oxides: charge generation and its impact on reliability. Microelectron. Reliab. 41:2001;1007-1010.
-
(2001)
Microelectron. Reliab.
, vol.41
, pp. 1007-1010
-
-
Schwalke, U.1
Pölzl, M.2
Sekinger, T.3
Kerber, M.4
-
3
-
-
3042851012
-
Correlation between dielectric breakdown and charge generation in silicon dioxide films
-
Hayakawa T., Watanabe Y., et al. Correlation between dielectric breakdown and charge generation in silicon dioxide films. Appl. Phys. Lett. 70:1997;2699-2701.
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 2699-2701
-
-
Hayakawa, T.1
Watanabe, Y.2
-
4
-
-
21544458715
-
Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon
-
Dimaria D., Cartier E., Arnold D. Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon. J. Appl. Phys. 73(7):1993;3367-3384.
-
(1993)
J. Appl. Phys.
, vol.73
, Issue.7
, pp. 3367-3384
-
-
Dimaria, D.1
Cartier, E.2
Arnold, D.3
-
6
-
-
0001370175
-
The maximum dielectric strength of thin silicon dioxide films
-
Klein N. The maximum dielectric strength of thin silicon dioxide films. IEEE Trans. Electron Devices. ED-13(12):1966;281-289.
-
(1966)
IEEE Trans. Electron Devices
, vol.ED-13
, Issue.12
, pp. 281-289
-
-
Klein, N.1
-
7
-
-
0017532603
-
Breakdown in silicon dioxide - A review
-
Solomon P. Breakdown in silicon dioxide - a review. J. Vac. Sci. Technol. 14(5):1977;1122-1130.
-
(1977)
J. Vac. Sci. Technol.
, vol.14
, Issue.5
, pp. 1122-1130
-
-
Solomon, P.1
-
8
-
-
0026188097
-
Breakdown voltage enhancement for devices on thin silcon layer/silicon dioxide film
-
Nagakawa A., Yasuhara N., Baba Y. Breakdown voltage enhancement for devices on thin silcon layer/silicon dioxide film. IEEE Trans. Electron Devices. ED-38(7):1991;1650-1654.
-
(1991)
IEEE Trans. Electron Devices
, vol.ED-38
, Issue.7
, pp. 1650-1654
-
-
Nagakawa, A.1
Yasuhara, N.2
Baba, Y.3
-
9
-
-
0026188096
-
High-voltage planar devices using field plate and semi-resistive layers
-
Jaume D., Charitat G., Reynes J.M., Rossel P. High-voltage planar devices using field plate and semi-resistive layers. IEEE Trans. Electron Devices. ED-38(7):1991;1681-1684.
-
(1991)
IEEE Trans. Electron Devices
, vol.ED-38
, Issue.7
, pp. 1681-1684
-
-
Jaume, D.1
Charitat, G.2
Reynes, J.M.3
Rossel, P.4
-
10
-
-
0000750592
-
Comparative study of gated single crystal silicon and polysilicon field emitters
-
Huq S.E., Grayer G.H., Prewett P.D. Comparative study of gated single crystal silicon and polysilicon field emitters. J. Vac. Sci. Technol. B. 15:1997;2855-2858.
-
(1997)
J. Vac. Sci. Technol. B
, vol.15
, pp. 2855-2858
-
-
Huq, S.E.1
Grayer, G.H.2
Prewett, P.D.3
-
11
-
-
85086493745
-
A micro-fabricated colloidal thruster array
-
Utah, 8-11 July, AIAA Paper no. 2001-3329
-
M.D. Paine, S. Gabriel, A micro-fabricated colloidal thruster array, in: Proceedings of the 37th AIAA Joint Propulsion Conference, Utah, 8-11 July 2001, AIAA Paper no. 2001-3329.
-
(2001)
Proceedings of the 37th AIAA Joint Propulsion Conference
-
-
Paine, M.D.1
Gabriel, S.2
-
12
-
-
3042769847
-
Micro Newton colloid thruster system development
-
Pasadena, 15-19 October, IEPC Paper no. 01-281
-
V. Hruby, M. Gamero-Castano, P. Falkos, S. Shenoy, Micro Newton colloid thruster system development, in: Proceedings of the 27th IEPC, Pasadena, 15-19 October 2001, IEPC Paper no. 01-281.
-
(2001)
Proceedings of the 27th IEPC
-
-
Hruby, V.1
Gamero-Castano, M.2
Falkos, P.3
Shenoy, S.4
-
13
-
-
3042768240
-
-
Ireland, October
-
M.D. Paine, C.G.J. Schabmueller, A.G.R. Evans, S. Gabriel, in: Proceedings of the 12th Micromechanics Europe Workshop, Ireland, October 2001.
-
(2001)
Proceedings of the 12th Micromechanics Europe Workshop
-
-
Paine, M.D.1
Schabmueller, C.G.J.2
Evans, A.G.R.3
Gabriel, S.4
-
14
-
-
0020116163
-
Surface flashover of solid dielectric in vacuum
-
Pillai A.S., Hackam R. Surface flashover of solid dielectric in vacuum. J. Appl. Phys. 53:1982;2983-2987.
-
(1982)
J. Appl. Phys.
, vol.53
, pp. 2983-2987
-
-
Pillai, A.S.1
Hackam, R.2
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