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Volumn 2, Issue 4, 2003, Pages 314-321

Power bus signal integrity improvement and EMI mitigation on multilayer high-speed digital PCBs with embedded capacitance

Author keywords

Electric field strength; Embedded capacitance; Power bus; Power supply decoupling; Power ground layers; S parameters

Indexed keywords

CAPACITANCE; ELECTRIC FIELD EFFECTS; ELECTRIC POWER DISTRIBUTION; ELECTROMAGNETIC COMPATIBILITY; FREQUENCIES; MICROPROCESSOR CHIPS; MULTILAYERS; PRINTED CIRCUIT BOARDS; SCATTERING PARAMETERS; SIGNAL INTERFERENCE;

EID: 3042805209     PISSN: 15361233     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMC.2003.1255646     Document Type: Article
Times cited : (13)

References (12)
  • 5
    • 0035519745 scopus 로고    scopus 로고
    • Power supply decoupling on fully populated high speed digital PCBs
    • Nov.
    • V. Ricchiuti, "Power Supply Decoupling on Fully Populated High Speed Digital PCBs," IEEE Trans. EMC, vol. 43, no. 4, Nov. 2001.
    • (2001) IEEE Trans. EMC , vol.43 , Issue.4
    • Ricchiuti, V.1
  • 6
    • 0036382294 scopus 로고    scopus 로고
    • Reduction in radiated emission by symmetrical power-ground layer stack-Up PCB with no open edge
    • S. Haga, K. Nakano, and O. Hashimoto, "Reduction in Radiated Emission by Symmetrical Power-Ground Layer Stack-Up PCB with No Open Edge," Proc. IEEE Int'l Symp. EMC, 2002.
    • (2002) Proc. IEEE Int'l Symp. EMC
    • Haga, S.1    Nakano, K.2    Hashimoto, O.3
  • 7
    • 0037843711 scopus 로고    scopus 로고
    • Quantification of the radiation level of power-bus structures on printed circuit boards
    • Sept.
    • M. Leone and L. Jung, "Quantification of the Radiation Level of Power-Bus Structures on Printed Circuit Boards," Proc. EMC Europe 2002 Symp., pp. 317-321, Sept. 2002.
    • (2002) Proc. EMC Europe 2002 Symp. , pp. 317-321
    • Leone, M.1    Jung, L.2
  • 9
    • 0028369284 scopus 로고
    • Conversions between S, Z, Y, h, ABCD, and T parameters which are valid for complex source and load impedances
    • Feb.
    • D.A. Frickey, "Conversions. Between S, Z, Y, h, ABCD, and T Parameters which are Valid for Complex Source and Load Impedances," IEEE Trans. Microwave Theory Technology, vol. 42, no. 2, pp. 205-211, Feb. 1994.
    • (1994) IEEE Trans. Microwave Theory Technology , vol.42 , Issue.2 , pp. 205-211
    • Frickey, D.A.1
  • 10
    • 0031273747 scopus 로고    scopus 로고
    • An experimental procedure for characterizing interconnects to the DC power bus on a multilayer printed circuit board
    • Nov.
    • H. Shi, F. Sha, J.L. Drewniak, T.P. Van Doren, and J.H. Hubing, "An Experimental Procedure for Characterizing Interconnects to the DC Power Bus on a Multilayer Printed Circuit Board," IEEE Trans. EMC, vol. 39, pp. 279-285, Nov. 1997.
    • (1997) IEEE Trans. EMC , vol.39 , pp. 279-285
    • Shi, H.1    Sha, F.2    Drewniak, J.L.3    Van Doren, T.P.4    Hubing, J.H.5
  • 12
    • 23544480620 scopus 로고    scopus 로고
    • Computer Simulation Technology, CST Microwave Studio Manual, vol. I-II, 2003, www.cst.del.
    • (2003) CST Microwave Studio Manual , vol.1-2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.