Growth process and characterization of magnetic semiconductors based on GeMn alloy films

Physica Status Solidi C: Conferences

Volumn 1, Issue 7, 2004, Pages 1748-1751

  Pinto, N ^a   Morresi, L ^a   Murri, R ^a   D'Orazio, F ^b   Lucari, F ^b   Passacantando, M ^b   Picozzi, P ^b  

^a UNIVERSITY OF CAMERINO   (Italy)

^b UNIVERSITY OF L'AQUILA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; FILM GROWTH; GERMANIUM ALLOYS; GRAIN SIZE AND SHAPE; KERR MAGNETOOPTICAL EFFECT; MAGNETIC SEMICONDUCTORS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; X RAY DIFFRACTION;

BUFFER LAYERS; CURIE TEMPERATURE; THREE-DIMENSIONAL GROWTH;

THIN FILMS;

EID: 3042790183     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200304409     Document Type: Conference Paper

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