Application of principal component analysis to ellipsometric spectra

Journal of Physical Chemistry B

Volumn 108, Issue 23, 2004, Pages 7748-7753

  Brouwer, E A Martijn ^a   Kooij, E Stefan ^a   Wormeester, Herbert ^a   Hempenius, Mark A ^a   Poelsema, Bene ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COLLOIDS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GOLD; POLYELECTROLYTES; PRINCIPAL COMPONENT ANALYSIS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICA;

ELLIPSOMETRIC SPECTRA; FILM THICKNESS; REFLECTION SPECTROMETRY; TIME-OF-FLIGHT MASS SPECTROSCOPY;

ELLIPSOMETRY;

EID: 3042720054     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0494234     Document Type: Article

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