Imaging a dense nanodot assembly by phase retrieval from TEM images

Ultramicroscopy

Volumn 100, Issue 1-2, 2004, Pages 79-90

  Donnadieu, P ^a   Verdier, M ^a   Berthome G ^a   Mur, P ^b  

^a UNIV GRENOBLE ALPES   (France)

^b CEA LETI   (France)

Author keywords

42.30; 61.48; Defocus variation; Nanodot; Phase retrieval; TEM; Transport intensity equation

Indexed keywords

APPROXIMATION THEORY; IMAGE PROCESSING; INVERSE PROBLEMS; ITERATIVE METHODS; OPTICAL FILTERS; PROBLEM SOLVING;

DENSE NANODOT ASSEMBLY; PHASE RETRIEVAL;

TRANSMISSION ELECTRON MICROSCOPY;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGING; MATHEMATICAL MODEL; NANOTECHNOLOGY; NOISE; PHASE TRANSITION; TRANSMISSION ELECTRON MICROSCOPY;

FOURIER ANALYSIS; IMAGE PROCESSING, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON; MICROSCOPY, PHASE-CONTRAST; SILICON;

EID: 3042691003     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.01.007     Document Type: Article

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