Ferromagnetic resonance linewidth in CoNi/FeMn bilayers

Applied Physics A: Materials Science and Processing

Volumn 79, Issue 3, 2004, Pages 701-705

  Yuan, S L ^a   Wang, L ^a   Shan, R ^a   Zhou, S M ^a,b  

^a FUDAN UNIVERSITY   (China)

^b NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COBALT COMPOUNDS; COUPLED CIRCUITS; CRYSTALLOGRAPHY; DEMAGNETIZATION; IRON COMPOUNDS; MANGANESE COMPOUNDS; METALLIC FILMS; NICKEL COMPOUNDS; SINGLE CRYSTALS; SPUTTERING; SWITCHING; THICKNESS CONTROL;

BILAYERS; GILBERT DAMPING EFFECT; LAYER THICKNESS; LINEWIDTH;

FERROMAGNETIC RESONANCE;

EID: 3042647045     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-003-2316-0     Document Type: Article

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