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Volumn 40, Issue 2 A, 2001, Pages 580-585

The study on ferromagnetic resonance linewidth for NM/80NiFe/NM (NM = Cu, Ta, Pd and Pt) films

Author keywords

80NiFe; Ferromagnetic resonance; Gilbert damping parameter; Linewidth; Magnetic inhomogeneities

Indexed keywords

ATOMIC FORCE MICROSCOPY; DAMPING; DEMAGNETIZATION; FERROMAGNETIC RESONANCE; MAGNETIC ANISOTROPY; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; MAGNETRON SPUTTERING; MORPHOLOGY; NUMERICAL ANALYSIS; SURFACES; THICKNESS MEASUREMENT;

EID: 0035246473     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.580     Document Type: Article
Times cited : (348)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.