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Volumn 40, Issue 2 A, 2001, Pages 580-585
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The study on ferromagnetic resonance linewidth for NM/80NiFe/NM (NM = Cu, Ta, Pd and Pt) films
a a a |
Author keywords
80NiFe; Ferromagnetic resonance; Gilbert damping parameter; Linewidth; Magnetic inhomogeneities
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DAMPING;
DEMAGNETIZATION;
FERROMAGNETIC RESONANCE;
MAGNETIC ANISOTROPY;
MAGNETIC VARIABLES MEASUREMENT;
MAGNETIZATION;
MAGNETRON SPUTTERING;
MORPHOLOGY;
NUMERICAL ANALYSIS;
SURFACES;
THICKNESS MEASUREMENT;
GILBERT DAMPING PARAMETER;
LANDAU-LIFSHITZ-GILBERT EQUATION;
LINEWIDTH;
MAGNETIC INHOMOGENIETIES;
OUT OF PLANE ANGULAR DEPENDENCE;
SUPERCONDUCTING FILMS;
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EID: 0035246473
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.40.580 Document Type: Article |
Times cited : (348)
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References (24)
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