Defining a BIST-oriented signature for mixed-signal devices

2003 Southwest Symposium on Mixed-Signal Design, SSMSD 2003

Volumn , Issue , 2003, Pages 202-207

  Corsi, F ^a   Marzocca, C ^a   Matarrese, G ^a  

^a POLITECNICO DI BARI   (Italy)

Author keywords

Built in self test; Chebyshev approximation; Circuit testing; Design for testability; Hardware; Low pass filters; Noise measurement; Pulse generation; System testing; System on a chip

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; BUTTERWORTH FILTERS; CHEBYSHEV APPROXIMATION; COMPUTER HARDWARE; DESIGN FOR TESTABILITY; ELECTRIC SIGNAL SYSTEMS; HARDWARE; INTEGRATED CIRCUITS; LOW PASS FILTERS; MIXED SIGNAL INTEGRATED CIRCUITS; PULSE GENERATORS; SIGNAL FILTERING AND PREDICTION; SYSTEM-ON-CHIP;

CIRCUIT TESTING; NOISE MEASUREMENTS; PULSE GENERATION; SYSTEM ON A CHIP; SYSTEM TESTING;

BUILT-IN SELF TEST;

EID: 3042639059     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SSMSD.2003.1190427     Document Type: Conference Paper

References (8)

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